Advanced Computing in Electron Microscopy

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Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this ed...
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Preface to Second Edition Several new topics have been added, some small errors have been corrected and some new references have been added in this edition. New topics include aberration corrected instruments, scanning confocal mode of operations, Bloch wave eigenvalue methods and parallel computing techniques. The ?rst edition - cluded a CD with computer programs, which is not included in this ed...
Read more
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  • Formats: pdf
  • ISBN: 9781441965332
  • Publication Date: 12 Aug 2010
  • Publisher: Springer US
  • Product language: English
  • Drm Setting: DRM