Advanced Test Methods for SRAMs

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for te...

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89.50 £

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for te...

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  • Formats: pdf
  • ISBN: 9781441909381
  • Publication Date: 8 Oct 2009
  • Publisher: Springer US
  • Product language: English
  • Drm Setting: DRM