Applied Crystallography - Proceedings Of The Xvii International Conference

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This proceedings volume contains research data on structural investigation of materials of high industrial value. In particular, the following issues are discussed: phase characterization by diffraction methods, application of direct methods for solving crystal structure from powder diffraction, electron crystallography, Rietveld method application, defects and substructure analysis in materials, ...
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This proceedings volume contains research data on structural investigation of materials of high industrial value. In particular, the following issues are discussed: phase characterization by diffraction methods, application of direct methods for solving crystal structure from powder diffraction, electron crystallography, Rietveld method application, defects and substructure analysis in materials, ...
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  • Formats: pdf
  • ISBN: 9789814545556
  • Publication Date: 6 Aug 1998
  • Publisher: World Scientific Publishing Company
  • Product language: English
  • Drm Setting: DRM