Atom-Probe Tomography

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Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.

Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to da...

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129.50 £

Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.

Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to da...

Read more
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  • Formats: pdf
  • ISBN: 9781489974303
  • Publication Date: 31 Jul 2014
  • Publisher: Springer US
  • Product language: English
  • Drm Setting: DRM