Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

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Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new...

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179.50 £

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new...

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  • Formats: pdf
  • ISBN: 9783540284727
  • Publication Date: 24 Oct 2006
  • Publisher: Springer Berlin Heidelberg
  • Product language: English
  • Drm Setting: DRM