Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

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Sam Boggs, JrSam Boggs, Jr, Tovey, N. Keith, Pye, Kenneth, Krinsley, David H.
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  • Formats: pdf
  • ISBN: 9780511628894
  • Publication Date: 21 Jan 2010
  • Publisher: Cambridge University Press
  • Product language: English
  • Drm Setting: DRM