Concurrency and Hardware Design
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As CMOS semiconductor technology strides towards billions of transistors on a single die new problems arise on the way. They are concerned with the - minishing fabrication process features, which a?ect for example the gate-to-wire delay ratio. They manifest themselves in greater variations of size and operating parameters of devices, which put the overall reliability of systems at risk. And, most ...
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As CMOS semiconductor technology strides towards billions of transistors on a single die new problems arise on the way. They are concerned with the - minishing fabrication process features, which a?ect for example the gate-to-wire delay ratio. They manifest themselves in greater variations of size and operating parameters of devices, which put the overall reliability of systems at risk. And, most ...
Read more