Defects in Microelectronic Materials and Devices

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Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe
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Uncover the Defects that Compromise Performance and ReliabilityAs microelectronics features and devices become smaller and more complex, it is critical that engineers and technologists completely understand how components can be damaged during the increasingly complicated fabrication processes required to produce them.A comprehensive survey of defe

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  • Formats: pdf
  • ISBN: 9781420043778
  • Publication Date: 19 Nov 2008
  • Publisher: CRC Press
  • Product language: English
  • Drm Setting: DRM