Design for Testability, Debug and Reliability

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particul...

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This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particul...

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  • Formats: epub
  • ISBN: 9783030692094
  • Publication Date: 19 Apr 2021
  • Publisher: Springer International Publishing
  • Product language: English
  • Drm Setting: DRM