Electromigration in Metals

Available
0
StarStarStarStarStar
0Reviews
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reli...
Read more
E-book
pdf
Price
78.00 £
Learn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reli...
Read more
Follow the Author

Options

  • Formats: pdf
  • ISBN: 9781009287791
  • Publication Date: 12 May 2022
  • Publisher: Cambridge University Press
  • Product language: English
  • Drm Setting: DRM