Introduction to Spectroscopic Ellipsometry of Thin Film Materials

A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization

In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characte...