Memory, Microprocessor, and ASIC

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Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
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epub
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175.00 £
Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons

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  • Formats: epub
  • ISBN: 9781135499259
  • Publication Date: 26 Mar 2003
  • Publisher: CRC Press
  • Product language: English
  • Drm Setting: DRM