Negative Differential Resistance and Instabilities in 2-D Semiconductors

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Instabilities associated with hot electrons in semiconductors have been investigated from the beginning of transistor physics in the 194Os. The study of NDR and impact ionization in bulk material led to devices like the Gunn diode and the avalanche-photo-diode. In layered semiconductors domain formation in HEMTs can lead to excess gate leakage and to excess noise. The studies of hot electron trans...
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Instabilities associated with hot electrons in semiconductors have been investigated from the beginning of transistor physics in the 194Os. The study of NDR and impact ionization in bulk material led to devices like the Gunn diode and the avalanche-photo-diode. In layered semiconductors domain formation in HEMTs can lead to excess gate leakage and to excess noise. The studies of hot electron trans...
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  • Formats: pdf
  • ISBN: 9781461528227
  • Publication Date: 6 Dec 2012
  • Publisher: Springer US
  • Product language: English
  • Drm Setting: DRM