Next Generation HALT and HASS

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NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS

A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress sc...

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NEXT GENERATION HALT AND HASS ROBUST DESIGN OF ELECTRONICS AND SYSTEMS

A NEW APPROACH TO DISCOVERING AND CORRECTING SYSTEMS RELIABILITY RISKS

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress sc...

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  • Formats: pdf
  • ISBN: 9781118700204
  • Publication Date: 8 Mar 2016
  • Publisher: Wiley
  • Product language: English
  • Drm Setting: DRM