Semiconductor Material and Device Characterization

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This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines n...

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pdf
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180.95 £
This Third Edition updates a landmark text with the latest findings

The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines n...

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  • Formats: pdf
  • ISBN: 9780471749080
  • Publication Date: 25 Oct 2006
  • Publisher: Wiley
  • Product language: English
  • Drm Setting: DRM