Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and comp...

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product_type_E-book
pdf
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89.50 £

Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have  become imperative for the successful design of VLSI chips.

This book provides readers with tools for variation-aware design methodologies and comp...

Read more
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  • Formats: pdf
  • ISBN: 9781461407881
  • Publication Date: 8 Jul 2014
  • Publisher: Springer New York
  • Product language: English
  • Drm Setting: DRM