Testing at the Speed of Light

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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased...

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Spacecraft depend on electronic components that must perform reliably over missions measured in years and decades. Space radiation is a primary source of degradation, reliability issues, and potentially failure for these electronic components. Although simulation and modeling are valuable for understanding the radiation risk to microelectronics, there is no substitute for testing, and an increased...

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  • Formats: epub
  • ISBN: 9780309470827
  • Publication Date: 8 Jun 2018
  • Publisher: National Academies Press
  • Product language: English
  • Drm Setting: DRM