Thin Film Analysis by X-Ray Scattering

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With contributions by Paul F. Fewster and Christoph Genzel

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physic...
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With contributions by Paul F. Fewster and Christoph Genzel

While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physic...
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  • Formats: pdf
  • ISBN: 9783527607044
  • Publication Date: 12 May 2006
  • Publisher: Wiley
  • Product language: English
  • Drm Setting: DRM