X-ray Scattering From Semiconductors

Available
0
StarStarStarStarStar
0Reviews
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface st...
Read more
product_type_E-book
pdf
Price
33.00 £
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface st...
Read more
Follow the Author

Options

  • Formats: pdf
  • ISBN: 9781783262076
  • Publication Date: 27 Oct 2000
  • Publisher: World Scientific Publishing Company
  • Product language: English
  • Drm Setting: DRM